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  • Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

    Series series Engineering (R0)
    This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC ... Read more

    $89.09 USD