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Engineering (R0) eBook Series

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  • Fundamentals of Bias Temperature Instability in MOS Transistors

    Characterization Methods, Process and Materials Impact, DC and AC Modeling

    Edited by Souvik Mahapatra ...
    Series series Engineering (R0)
    This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator ... Read more

    $89.09 USD