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Engineering (R0) eBook Series

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  • Noise in Nanoscale Semiconductor Devices

    Edited by Tibor Grasser ...
    Series series Engineering (R0)
    This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more ... Read more

    $80.09 USD

  • Bias Temperature Instability for Devices and Circuits

    Edited by Tibor Grasser ...
    Series series Engineering (R0)
    This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, ... Read more

    $98.09 USD

  • Hot Carrier Degradation in Semiconductor Devices

    Edited by Tibor Grasser ...
    Series series Engineering (R0)
    This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, ... Read more

    $98.09 USD