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  • Noise in Nanoscale Semiconductor Devices

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more ... Leer más

    $80.09 USD

  • Hot Carrier Degradation in Semiconductor Devices

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, ... Leer más

    $98.09 USD

  • Bias Temperature Instability for Devices and Circuits

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, ... Leer más

    $98.09 USD

  • Organic Electronics

    Edición de Gregor Meller, Tibor Grasser ...
    Series series Chemistry and Material Science (R0)
    Dear Readers, Since the ground-breaking, Nobel-prize crowned work of Heeger, MacDiarmid, and Shirakawa on molecularly doped polymers and polymers with an alternating bonding structure at the end of the 1970s, the academic and industrial research on hydrocarbon-based semiconducting materials and devices has made encouraging progress. The strengths of semiconducting polymers are currently mainly ... Leer más

    $287.09 USD

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  • Advanced Materials

    Techniques, Physics, Mechanics and Applications

    Series series Springer Nature Proceedings excluding Computer Science
    This book presents 50 selected peer-reviewed reports from the 2016 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2016 (Surabaya, Indonesia, 19–22 July, 2016). The Proceedings are devoted to processing techniques, physics, mechanics, and applications of advanced materials. As such, they examine a wide spectrum of nanostructures, ferroelectric ... Leer más

    $287.99 USD

  • CMOS Test and Evaluation

    A Physical Perspective

    Series series Engineering (R0)
    CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers ... Leer más

    $116.99 USD

  • Metallization of Polymers 2

    Edición de Edward Sacher ...
    Series series Chemistry and Material Science (R0)
    As the demands put on the polymer/metal interface, particularly by the microelectronics industry, become more and more severe, the necessity for understanding this interface, its properties and its limitations, becomes more and more essential. This requires a broad knowledge of, and a familiarity with, the latest findings in this rapidly advancing field. At the very least, such familiarity ... Leer más

    $89.99 USD

  • Electromigration Modeling at Circuit Layout Level

    Series series Engineering (R0)
    Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief ... Leer más

    $49.49 USD

  • Semiconductor Technologies in the Era of Electronics

    Series series Engineering (R0)
    Technological advances in the field of materials, devices, circuits, and systems began by the discovery of new properties of objects, or the entrepreneurship with the applications of unique or practical concepts for commercial goods. To implement products using these findings and challenges textbook knowledge is usually sufficient. Semiconductor Technologies in the Era of Electronics therefore ... Leer más

    $89.99 USD

  • Assessing the Functional Structure of Molecular Transporters by EPR Spectroscopy

    Series series Chemistry and Material Science (R0)
    In his thesis, Matthias Junk takes an innovative approach to assess the local structure and dynamics of biological and synthetic amphiphilic macromolecules capable of transporting small molecules. Replacing the latter with stable radicals, he uses state-of-the-art electron paramagnetic resonance (EPR) spectroscopy to describe the highly relevant transport function from the viewpoint of the guest ... Leer más

    $89.09 USD

  • HPHT-Treated Diamonds

    Diamonds Forever

    Series series Physics and Astronomy (R0)
    High-temperature and high-pressure treatment of diamond is becoming an important technology to elaborate diamonds. This is the first book providing a comprehensive review of the properties of HPHT-treated diamonds, based on the analysis of published data and the work of the authors. The book gives a detailed analysis of the physics of transformation of internal structures of diamonds subjected to ... Leer más

    $224.09 USD

  • Research on the Radiation Effects and Compact Model of SiGe HBT

    de Yabin Sun ...
    Series series Engineering (R0)
    This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by ... Leer más

    $89.99 USD