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  • Lock-in Thermography

    Basics and Use for Evaluating Electronic Devices and Materials

    by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert ...
    Series series Physics and Astronomy (R0)
    This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state ... Read more

    $152.09 USD