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  • Spacer Engineered FinFET Architectures

    High-Performance Digital Circuit Applications

    This book focusses on the spacer engineering aspects of novel MOS-based device–circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations. ... Read more

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  • VLSI Design and Test

    26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers

    Series series Springer Nature Proceedings Computer Science
    This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital ... Read more

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  • VLSI Design and Test

    23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

    Series series Springer Nature Proceedings Computer Science
    This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power ... Read more

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  • VLSI Design and Test

    21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

    Series series Springer Nature Proceedings Computer Science
    This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and ... Read more

    $89.09 USD

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    Series series IEEE Press Series on Microelectronic Systems
    Offers a comprehensive overview of NAND flash memories, with insights into NAND history, technology, challenges, evolutions, and perspectivesDescribes new program disturb issues, data retention, power consumption, and possible solutions for the challenges of 3D NAND flash memoryWritten by an authority in NAND flash memory technology, with over 25 years’ experience ... Read more

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  • Electrical and Electronic Devices, Circuits and Materials

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  • Semiconductor Memory Devices and Circuits

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    This book covers semiconductor memory technologies from device bit-cell structures to memory array design with an emphasis on recent industry scaling trends and cutting-edge technologies. The first part of the book discusses the mainstream semiconductor memory technologies. The second part of the book discusses the emerging memory candidates that may have the potential to change the memory ... Read more

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  • 3D Flash Memories

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    This book walks the reader through the next step in the evolution of NAND flash memory technology, namely the development of 3D flash memories, in which multiple layers of memory cells are grown within the same piece of silicon. It describes their working principles, device architectures, fabrication techniques and practical implementations, and highlights why 3D flash is a brand new technology ... Read more

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  • Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO

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    Series series Wiley Series in Display Technology
    Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO: Application to LSIThis book describes the application of c-axis aligned crystalline In-Ga-Zn oxide (CAAC-IGZO) technology in large-scale integration (LSI) circuits. The applications include Non-volatile Oxide Semiconductor Random Access Memory (NOSRAM), Dynamic Oxide Semiconductor Random Access Memory (DOSRAM), central processing ... Read more

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  • Recent Trends in the Condition Monitoring of Transformers

    Theory, Implementation and Analysis

    Series series Energy (R0)
    Recent Trends in the Condition Monitoring of Transformers reflects the current interest in replacing traditional techniques used in power transformer condition monitoring with non-invasive measures such as polarization/depolarization current measurement, recovery voltage measurement, frequency domain spectroscopy and frequency response analysis. The book stresses the importance of scrutinizing the ... Read more

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  • Device Circuit Co-Design Issues in FETs

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    This book provides an overview of emerging semiconductor devices and their applications in electronic circuits, which form the foundation of electronic devices. Device Circuit Co-Design Issues in FETs provides readers with a better understanding of the ever-growing field of low-power electronic devices and their applications in the wireless, biosensing, and circuit domains. The book brings ... Read more

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  • Handbook of Advanced Semiconductor Field Effect Transistors

    Advance your understanding of semiconductor technology with this indispensable handbook, offering an in-depth look at the modeling, simulation, and fabrication of advanced nanoscale semiconductor field-effect transistors (FETs).Advanced nanoscale semiconductor field-effect transistors (FETs) represent a pivotal advancement in semiconductor technology, catering to the growing demand for energy ... Read more

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