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Top Series in United States

Showing 1 - 12 of 12 results for “simon li”
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  • 3D TCAD Simulation for Semiconductor Processes, Devices and Optoelectronics

    by Suihua Li, Simon Li ...
    Series series Engineering (R0)
    Technology computer-aided design, or TCAD, is critical to today’s semiconductor technology and anybody working in this industry needs to know something about TCAD. This book is about how to use computer software to manufacture and test virtually semiconductor devices in 3D. It brings to life the topic of semiconductor device physics, with a hands-on, tutorial approach that de-emphasizes abstract ... Read more

    $98.09 USD

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  • Principles of VLSI RTL Design

    A Practical Guide

    by Sanjay Churiwala, Sapan Garg ...
    Series series Engineering (R0)
    Since register transfer level (RTL) design is less about being a bright engineer, and more about knowing the downstream implications of your work, this book explains the impact of design decisions taken that may give rise later in the product lifecycle to issues related to testability, data synchronization across clock domains, synthesizability, power consumption, routability, etc., all which are ... Read more

    $80.09 USD

  • Formal Development of a Network-Centric RTOS

    Software Engineering for Reliable Embedded Systems

    by Eric Verhulst, Raymond T. Boute, José Miguel Sampaio Faria, Bernhard H.C. Sputh, Vitaliy Mezhuyev ...
    Series series Engineering (R0)
    Many systems, devices and appliances used routinely in everyday life, ranging from cell phones to cars, contain significant amounts of software that is not directly visible to the user and is therefore called "embedded". For coordinating the various software components and allowing them to communicate with each other, support software is needed, called an operating system (OS). Because embedded ... Read more

    $98.09 USD

  • Circuit Design for Reliability

    Edited by Ricardo Reis, Yu Cao, Gilson Wirth ...
    Series series Engineering (R0)
    This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability ... Read more

    $89.09 USD

  • SystemVerilog for Verification

    A Guide to Learning the Testbench Language Features

    by Chris Spear, Greg Tumbush ...
    Series series Engineering (R0)
    Based on the highly successful second edition, this extended edition of SystemVerilog for Verification: A Guide to Learning the Testbench Language Features teaches all verification features of the SystemVerilog language, providing hundreds of examples to clearly explain the concepts and basic fundamentals. It contains materials for both the full-time verification engineer and the student learning ... Read more

    $62.99 USD

  • Advanced Test Methods for SRAMs

    Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

    by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel ...
    Series series Engineering (R0)
    Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for ... Read more

    $89.09 USD

  • Legacy Data: A Structured Methodology for Device Migration in DSM Technology

    by Pallab Chatterjee ...
    Series series Computer Science (R0)
    Legacy Data: A Structured Methodology For Device Migration in DSM Technology deals with the migration of existing hard IP from one technology to another using repeatable procedures. The challenge of hard IP migration is not simply an EDA problem but rather a client application specification problem. It requires a deep understanding of the process technologies, EDA tools (and their interfaces) and ... Read more

    $89.99 USD

  • Power Amplifiers for the S-, C-, X- and Ku-bands

    An EDA Perspective

    by Mladen Božanić, Saurabh Sinha ...
    Series series Engineering (R0)
    This book provides a detailed review of power amplifiers, including classes and topologies rarely covered in books, and supplies sufficient information to allow the reader to design an entire amplifier system, and not just the power amplification stage. A central aim is to furnish readers with ideas on how to simplify the design process for a preferred power amplifier stage by introducing software ... Read more

    $89.09 USD

  • Process Variations and Probabilistic Integrated Circuit Design

    Edited by Manfred Dietrich, Joachim Haase ...
    Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book ... Read more

    $89.99 USD

  • Adaptable Embedded Systems

    Edited by Antonio Carlos Schneider Beck, Carlos Arthur Lang Lisbôa, Luigi Carro ...
    Series series Engineering (R0)
    As embedded systems become more complex, designers face a number of challenges at different levels: they need to boost performance, while keeping energy consumption as low as possible, they need to reuse existent software code, and at the same time they need to take advantage of the extra logic available in the chip, represented by multiple processors working together. This book describes several ... Read more

    $89.09 USD

  • Nanoscale Memory Repair

    by Masashi Horiguchi, Kiyoo Itoh ...
    Series series Engineering (R0)
    Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low ... Read more

    $98.09 USD

  • Automated Configuration Problem Solving

    by Charles J. Petrie ...
    Series series Computer Science (R0)
    Automated Configuration has long been the subject of intensive research, especially in Artificial Intelligence. It is a pervasive problem to be solved, and it is a good test of various knowledge representation and reasoning techniques. The problem shows up in applications such as various electrical circuit design, utility computing and even concurrent engineering.Automated Configuration Problem ... Read more

    $49.99 USD