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“s jayanthy”

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  • Test Generation of Crosstalk Delay Faults in VLSI Circuits

    by S. Jayanthy, M.C. Bhuvaneswari ...
    This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk ... Read more

    $134.99 USD