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  • Progress in Nanoscale Characterization and Manipulation

    Edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai ...
    Series series Physics and Astronomy (R0)
    This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research ... Read more

    $107.09 USD