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  • Scanning Transmission Electron Microscopy

    Imaging and Analysis

    Series series Chemistry and Material Science (R0)
    Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from ... Read more

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    An Introduction to Atomic-Level Silicon Engineering

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    This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques.The book is aimed at young ... Read more

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    Series series Engineering (R0)
    CMOS Processors and Memories addresses the-state-of-the-art in integrated circuit design in the context of emerging computing systems. New design opportunities in memories and processor are discussed. Emerging materials that can take system performance beyond standard CMOS, like carbon nanotubes, graphene, ferroelectrics and tunnel junctions are explored.CMOS Processors and Memories is divided ... Read more

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    Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and ... Read more

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    Series series Springer Nature Proceedings excluding Computer Science
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  • Theory of Quantum Transport at Nanoscale

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    Series series Physics and Astronomy (R0)
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  • Surface Microscopy with Low Energy Electrons

    by Ernst Bauer ...
    Series series Chemistry and Material Science (R0)
    This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include ... Read more

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