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  • Conductive Atomic Force Microscopy

    Applications in Nanomaterials

    Edited by Mario Lanza ...
    The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help ... Read more

    $151.00 USD