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  • Electron Microscopy and Analysis 2001

    Edited by M. Aindow, C. J. Kiely ...
    Series series Institute of Physics Conference Series
    Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for ... Read more

    $440.00 USD