Skip to main content
Search Button
United States Kobo store Gift Cards Help

Rakuten Kobo

Wishlist

Shopping Cart

You're getting the VIP treatment!

Item(s) unavailable for purchase
Please review your cart. You can remove the unavailable item(s) now or we'll automatically remove it at Checkout.
itemsitem
itemsitem

Recommended For You

Loading...


Top Series in United States

Showing 1 - 12 of 12 results for “eric verhulst”
Skip side bar filters

  • Formal Development of a Network-Centric RTOS

    Software Engineering for Reliable Embedded Systems

    by Eric Verhulst, Raymond T. Boute, José Miguel Sampaio Faria, Bernhard H.C. Sputh, Vitaliy Mezhuyev ...
    Series series Engineering (R0)
    Many systems, devices and appliances used routinely in everyday life, ranging from cell phones to cars, contain significant amounts of software that is not directly visible to the user and is therefore called "embedded". For coordinating the various software components and allowing them to communicate with each other, support software is needed, called an operating system (OS). Because embedded ... Read more

    $98.09 USD

People who read this also enjoyed

  • SystemVerilog for Verification

    A Guide to Learning the Testbench Language Features

    by Chris Spear, Greg Tumbush ...
    Series series Engineering (R0)
    Based on the highly successful second edition, this extended edition of SystemVerilog for Verification: A Guide to Learning the Testbench Language Features teaches all verification features of the SystemVerilog language, providing hundreds of examples to clearly explain the concepts and basic fundamentals. It contains materials for both the full-time verification engineer and the student learning ... Read more

    $62.99 USD

  • Advanced Test Methods for SRAMs

    Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

    by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel ...
    Series series Engineering (R0)
    Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for ... Read more

    $89.09 USD

  • Principles of VLSI RTL Design

    A Practical Guide

    by Sanjay Churiwala, Sapan Garg ...
    Series series Engineering (R0)
    Since register transfer level (RTL) design is less about being a bright engineer, and more about knowing the downstream implications of your work, this book explains the impact of design decisions taken that may give rise later in the product lifecycle to issues related to testability, data synchronization across clock domains, synthesizability, power consumption, routability, etc., all which are ... Read more

    $80.09 USD

  • Programming Many-Core Chips

    by András Vajda ...
    Series series Engineering (R0)
    This book presents new concepts, techniques and promising programming models for designing software for chips with "many" (hundreds to thousands) processor cores. Given the scale of parallelism inherent to these chips, software designers face new challenges in terms of operating systems, middleware and applications. This will serve as an invaluable, single-source reference to the state-of-the-art ... Read more

    $89.09 USD

  • Automotive Radar Sensors in Silicon Technologies

    by Payam Heydari, Vipul Jain ...
    Series series Engineering (R0)
    One of the leading causes of automobile accidents is the slow reaction of the driver while responding to a hazardous situation. State-of-the-art wireless electronics can automate several driving functions, leading to significant reduction in human error and improvement in vehicle safety. With continuous transistor scaling, silicon fabrication technology now has the potential to substantially ... Read more

    $89.09 USD

  • Nanoscale Memory Repair

    by Masashi Horiguchi, Kiyoo Itoh ...
    Series series Engineering (R0)
    Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low ... Read more

    $98.09 USD

  • Carbon Nanotube Electronics

    Edited by Jing Kong, Ali Javey ...
    Series series Engineering (R0)
    As the scaling limits of the conventional Si technology is approached, many have pursued alternative and revolutionary concepts as means to further improve the performance of future electronics. One such concept invovles the integration of carbon nanotube building blocks for active and passive components. The field of carbon nanotube electronics has recently received substantial attention from the ... Read more

    $98.09 USD

  • Bandpass Sigma Delta Modulators

    Stability Analysis, Performance and Design Aspects

    by Jurgen van Engelen, Rudy J. van de Plassche ...
    Sigma delta modulation has become a very useful and widely applied technique for high performance Analog-to-Digital (A/D) conversion of narrow band signals. Through the use of oversampling and negative feedback, the quantization errors of a coarse quantizer are suppressed in a narrow signal band in the output of the modulator. Bandpass sigma delta modulation is well suited for A/D conversion of ... Read more

    $170.99 USD

  • Error Control for Network-on-Chip Links

    by Bo Fu, Paul Ampadu ...
    This book provides readers with a comprehensive review of the state of the art in error control for Network on Chip (NOC) links. Coverage includes detailed description of key issues in NOC error control faced by circuit and system designers, as well as practical error control techniques to minimize the impact of these errors on system performance. ... Read more

    $89.09 USD

  • Winning the SoC Revolution

    Experiences in Real Design

    Edited by Grant Martin, Henry Chang ...
    In 1998-99, at the dawn of the SoC Revolution, we wrote Surviving the SOC Revolution: A Guide to Platform Based Design. In that book, we focused on presenting guidelines and best practices to aid engineers beginning to design complex System-on-Chip devices (SoCs). Now, in 2003, facing the mid-point of that revolution, we believe that it is time to focus on winning.In this book, Winning the SoC ... Read more

    $143.09 USD

  • Heterogeneous Multicore Processor Technologies for Embedded Systems

    by Kunio Uchiyama, Fumio Arakawa, Hironori Kasahara, Tohru Nojiri, Hideyuki Noda, Yasuhiro Tawara, Akio Idehara, Kenichi Iwata, Hiroaki Shikano ...
    To satisfy the higher requirements of digitally converged embedded systems, this book describes heterogeneous multicore technology that uses various kinds of low-power embedded processor cores on a single chip. With this technology, heterogeneous parallelism can be implemented on an SoC, and greater flexibility and superior performance per watt can then be achieved. This book defines the ... Read more

    $89.09 USD