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  • Modern Interferometry for Length Metrology

    Exploring limits and novel techniques

    by Dr. Florian Pollinger, Dr. Arnold Nicolaus, Dr. Guido Bartl, Dr Thilo Schuldt, Dr. Nandini Bhattacharya, Dr. Steven van den Berg, Prof. Dr. Seung-Woo Kim, Dr. Yoon-Soo Jang, Prof. Dr. Armin Reichhold, Dr. Birk Andreas, Dr. Christoph Weichert ...
    Series series IOP Expanding Physics
    Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling ... Read more

    $107.99 USD